talks

Table of Contents

Invited Presentations at Scientific Conferences (17)

Invited Seminars (51)

Contributed Presentations at Scientific Conferences (47)

Invited Presentations at Scientific Conferences (17)

  1. S. Heun, B. Radha, D. Ercolani, G. U. Kulkarni, F. Rossi, V. Grillo, G. Salviati, F. Beltram, and L. Sorba: Coexistence of Vapor-Liquid-Solid and Vapor-Solid-Solid growth modes in Pd-assisted InAs nanowires, Villa Conferences on Interactions among Nanostructures, Las Vegas, Nevada, USA, 21 - 25 April 2011. [Abstract] [Talk]

  2. S. Heun: Semiconductor Nanowires, National Seminar on The New Frontiers of Nanotechnology in Materials Science, Raja Lakhamagouda Science Institute, Belgaum, India, 26 – 27 November 2010. [Abstract] [Talk]

  3. S. Heun: Compositional mapping of semiconductor quantum dots by x-ray photoemission electron microscopy, Workshop on in situ characterization of near-surface processes, Leoben, Austria, 2 October 2009. [Abstract] [Talk]

  4. S. Heun: Photo Emission Electron Microscopy, Winter School on Synchrotron Radiation, Delmenhorst, Germany, 12 – 14 November 2008. [Talk]

  5. S. Heun, L. Sorba, G. Biasiol, T. Mlakar, R. Magri, A. Locatelli, and T. O. Mentes: Surface compositional profiles of self-assembled InAs/GaAs quantum rings, IUMRS-ICEM 2008, Sydney, Australia, 28 July – 1 August 2008. [Abstract] [Talk]

  6. S. Heun: Compositional mapping of individual semiconductor nanostructures, NanoE3, Couran Cove, Australia, 23 – 28 September 2007. [Abstract] [Talk]

  7. S. Heun, G. Biasiol, G. B. Golinelli, L. Sorba, F. Ratto, F. Rosei, S. Cherifi, S. Fontana, A. Locatelli, T. O. Mentes, F. Z. Guo, C. Hofer, C. Teichert, P.-D. Szkutnik, A. Sgarlata, M. De Crescenzi, and N. Motta: Spectromicroscopic investigation of semiconductor quantum dots, Iconsat 2006, New Delhi, India, 16 – 18 March 2006. [Abstract]

  8. S. Heun: Nanostructured materials for device applications, Pacifichem 2005, Honolulu, Hawaii, USA, 15 - 20 December 2005. [Abstract]

  9. S. Heun: Low-dimensional systems studied by SPELEEM, UK Synchrotron Radiation Users Meeting, Manchester, UK, 13 – 14 September 2005. [Abstract]

  10. S. Heun: Nanoscale Imaging and Spectroscopy with PEEM, Italian-Australian Workshop: Future Directions in Spectroscopy and Imaging with Synchrotron Radiation, Trieste, Italy, 9 – 11 February 2005. [Abstract]

  11. S. Heun: Nanospectroscopy with the SPELEEM at Elettra, 2nd International Symposium on Technologies and Applications of Photoelectron Micro-Spectroscopy with Laser-based VUV sources, Tsukuba, Japan, 1 – 3 February 2005. [Abstract]

  12. S. Heun: XPEEM with energy filter, National Synchrotron Light Source Annual Users’ Meeting, Brookhaven, USA, 17 – 20 May 2004. [Abstract] [Report]

  13. S. Heun, A. Bianco, S. Cherifi, D. Cocco, M. Kiskinova, A. Locatelli, M. Marsi, M. Pasqualetto, and E. Bauer: Nanospectroscopy with the SPELEEM at ELETTRA, International Symposium on Technologies and Applications of Photoelectron Micro-Spectroscopy with Laser-based VUV sources, Tsukuba, Japan, 2 – 4 December 2002. [Abstract]

  14. S. Heun, M. Lazzarino, P. Pingue, B.Ressel, and K. C. Prince: AFM local anodic oxidation studied by spectroscopic microscopy, 2nd International Workshop on Nano-scale Spectroscopy and Nanotechnology, Tokyo, Japan, 25 – 29 November 2002. [Abstract]

  15. S. Heun, Y. Watanabe, B. Ressel, D. Bottomley, Th. Schmidt, and K. C. Prince: Photoelectron spectroscopy from individual heteroepitaxial nanocrystals on GaAs(001), First International Workshop on Nano-scale Spectroscopy and its Applications to Semiconductor Research, Trieste, Italy, 11 - 14 December 2000. [Abstract]

  16. S. Heun, Th. Schmidt, J. Slezak, J. Diaz, K. C. Prince, E. Bauer, B. H. Müller, and A. Franciosi: Spectromicroscopy of low-dimensional systems, Third Workshop on Thin Film Physics and Technology, Trieste, Italy, 8 - 26 March 1999. [Abstract]

  17. S. Heun, Th. Schmidt, J. Slezak, J. Diaz, K. C. Prince, E. Bauer, B. Müller, and A. Franciosi: Semiconductor physics with the SPELEEM at Elettra, TUSBAR meeting, Trieste, Italy, 18 - 19 January 1999. [Abstract]

Invited Seminars (51)

  1. S. Heun: Semiconductor Nanowires, Zhejiang University, Hangzhou, China (Prof. Li Jixue), 28 June 2011. [Abstract] [Talk]

  2. S. Heun: Growth and Characterization of Semiconductor Nanowires, INRS-EMT, Univ. du Quebec, Varennes, Canada (Prof. F. Rosei), 2 May 2011. [Abstract] [Talk]

  3. N. Paradiso, S. Heun, S. Roddaro, D. Venturelli, F. Taddei, V. Giovannetti, R. Fazio, G. Biasiol, L. Sorba, and F. Beltram: Spatially–resolved analysis of edge–channel equilibration in quantum Hall circuits, Dept. of Physics, McGill University, Montreal, Canada (Prof. G. Gervais), 29 April 2011. [Abstract] [Talk]

  4. S. Heun: Growth and Characterization of Semiconductor Nanowires, NRC Institute for Microstructural Sciences, Ottawa, Canada (Dr. G. Austing), 28 April 2011. [Abstract] [Talk]

  5. S. Heun: Growth and Characterization of Semiconductor Nanowires, Centre for Advanced Nanotechnology, University of Toronto, Canada (Prof. H. Ruda), 26 April 2011. [Talk]

  6. S. Heun: Coexistence of Vapor–Liquid–Solid and Vapor–Solid–Solid Growth Modes in Pd-Assisted InAs Nanowires, Centre for Soft Matter Research, Bangalore, India (Prof. K. A. Suresh), 30 November 2010. [Abstract] [Talk]

  7. N. Paradiso, S. Heun, S. Roddaro, L. N. Pfeiffer, K. W. West, L. Sorba, G. Biasiol, and F. Beltram: Scanning gate microscopy and individual control of edge-channel transmission through a quantum point contact, ISSP, Tokyo University, Japan (Prof. Y. Hasegawa), 17 July 2009. [Abstract] [Talk]

  8. N. Paradiso, S. Heun, S. Roddaro, L. N. Pfeiffer, K. W. West, L. Sorba, G. Biasiol, and F. Beltram: Scanning gate microscopy and individual control of edge-channel transmission through a quantum point contact, NTT Basic Research Laboratories, Atsugi, Japan (Dr. H. Hibino), 16 July 2009. [Abstract] [Talk]

  9. S. Heun: InAs/GaAs quantum dots and rings, CNR Institute for Complex Systems, Sesto Fiorentino, Italy (Dr. P. Politi), 26 February 2008. [Abstract] [Talk]

  10. S. Heun: Compositional mapping of semiconductor quantum dots by x-ray photoemission electron microscopy, IV. Physikalisches Institut, Universitaet Goettingen, Germany (Prof. A. Rizzi), 23 November 2006.

  11. S. Heun, G. Biasiol, V. Grillo, E. Carlino, L. Sorba, G. B. Golinelli, A. Locatelli, T. O. Mentes, and F. Z. Guo: Surface compositional gradients of InAs/GaAs quantum dots, Materials Research Center, Indian Institute of Science, Bangalore, India (Prof. S. B. Krupanidhi), 14 March 2006. [Abstract]

  12. S. Heun: Spectromicroscopic investigations of nanostructured materials for device applications, Physics Department of Karnataka University, Dharwad, India, 11 March 2006. [Abstract]

  13. S. Heun: Local Anodic Oxidation with AFM: A Nanometer-Scale Spectroscopic Study with Photoemission Microscopy, Jawaharlal Nehru Centre for Advanced Scientific Research, Bangalore, India (Prof. G. Kulkarni), 8 September 2005.

  14. S. Heun: Local Anodic Oxidation of GaAs: A Nanometer-Scale Spectroscopic Study with PEEM, Paul Drude Institut, Berlin, Germany (Dr. S. Foelsch), 18 March 2005. [Abstract]

  15. S. Heun: Local Anodic Oxidation of GaAs: A Nanometer-Scale Spectroscopic Study with PEEM, Scuola Normale Superiore, Pisa, Italy (Prof. F. Beltram), 3 March 2005. [Abstract]

  16. S. Heun: Nanoscale Imaging and Spectroscopy with Photoemission Electron Microscopy, ISSP, University of Tokyo, Kashiwa, Japan (Prof. T. Kinoshita), 31 January 2005. [Abstract]

  17. S. Heun: The SPELEEM at the Nanospectroscopy Beamline at Elettra: Present status and performance, Spring-8, Hyogo, Japan (Prof. K. Kobayashi), 27 January 2005. [Abstract]

  18. S. Heun: Desorption dynamics of oxide nanostructures fabricated by local anodic oxidation, S3, University of Modena, Italy (Prof. E. Molinari), 2 November 2004. [Abstract]

  19. S. Heun: The local structure and chemical properties of LAO-oxide nanostructures, Jozef Stefan Institute, Ljubljana, Slovenia (Prof. A. Prodan), 9 September 2004. [Abstract]

  20. S. Heun: Desorption dynamics of LAO-oxide nanostructures, Australian National University, Canberra, Australia (Prof. B. Lewis), 27 July 2004. [Abstract]

  21. S. Heun: Chemical characterization of semiconductor nanostructures by energy filtered photoemission electron microscopy, Laboratoire Louis Neel, Grenoble, France (Dr. S. Cherifi), 1 July 2004. [Abstract]

  22. S. Heun: Chemical characterization of nanostructures by photoemission x-ray microscopy, Ohio University, Athens, USA (Prof. S.-W. Hla), 24 May 2004. [Abstract]

  23. S. Heun: AFM nanolithography studied by spectromicroscopy, Universitaet Essen, Germany (Prof. M. Horn-von Hoegen), 4 November 2003. [Abstract] [Talk]

  24. S. Heun: The Nanospectroscopy Beamline at Elettra, Synchrotron Radiation Research Center, Hsinchu, Taiwan (Dr. R. Klauser), 6 December 2002.

  25. S. Heun: The Nanospectroscopy Beamline at Elettra: present status and first results, Tokyo University, Japan (Prof. S. Hasegawa), 2 December 2002.

  26. S. Heun: Applications of spectromicroscopy at Elettra, Swiss Light Source, Villigen, Switzerland (Dr. C. Quitmann), 26 June 2001. [Abstract]

  27. S. Heun: Photoelectron spectroscopy on semiconductor nanostructures, Montanuniversitaet Leoben, Austria (Prof. C. Teichert), 17 May 2001. [Abstract]

  28. S. Heun: Nanospectroscopy on InAs nanocrystals, NTT Basic Research Laboratories, Atsugi, Japan (Dr. Y. Watanabe), 29 June 2000. [Abstract]

  29. S. Heun: Spectromicroscopy of nanostructures by SR-PEEM, Tokyo University, Japan (Prof. M. Oshima), 27 June 2000. [Abstract]

  30. S. Heun: Nano-scale photoelectron spectroscopy at Elettra, Electrotechnical Laboratories, AIST, Tsukuba, Japan (Dr. T. Tomie), 26 June 2000. [Abstract]

  31. S. Heun: The spectromicroscopy beamlines at Elettra: Recent achievements, Photon Factory, Tsukuba, Japan (Prof. Kakizaki), 23 June 2000. [Abstract]

  32. S. Heun: Nanospectroscopy of low-dimensional systems, University of Wisconsin-Madison, USA (Prof. M. Lagally), 25 August 1999. [Abstract]

  33. S. Heun: Applied semiconductor research with the SPELEEM at ELETTRA, Czech Academy of Sciences, Prague, Czech Republic (Prof. V. Chab), 19 February 1999. [Abstract]

  34. S. Heun: Semiconductor Physics with the SPELEEM at ELETTRA, Scuola Normale Superiore, Pisa, Italy (Prof. F. Beltram), 22 July 1998. [Abstract]

  35. S. Heun: The SPELEEM at ELETTRA: A new instrument for spectromicroscopy, Nova Gorica Polytechnic, Slovenia (Dr. G. Bratina), 21 May 1998. [Abstract]

  36. S. Heun: Stacking fault density and local interface composition in II-VI/III-V heterostructures, Tokyo Institute of Technology, Japan (Prof. K. Yagi), 3 April 1997.

  37. S. Heun: Interface composition and stacking fault density in II-VI/III-V heterostructures, Tokyo University, Japan (Prof. M. Oshima), 2 April 1997. [Abstract]

  38. S. Heun: Local interface composition and extended defect density in ZnSe/GaAs(001) and ZnSe/In0.04Ga0.96As(001) heterojunctions, JRCAT, AIST, Tsukuba, Japan (Prof. T. Yao), 1 April 1997.

  39. S. Heun: Strain and surface morphology in ZnSe/In0.04Ga0.96As(001) heterostructures, NTT Basic Research Laboratories, Atsugi, Japan (Dr. Y. Watanabe), 31 March 1997.

  40. S. Heun: Interface engineering of II-VI/III-V heterostructures, Sincrotrone Trieste, Italy (Dr. F. Esch), 10 March 1997.

  41. S. Heun: The influence of an ultrathin pseudomorphic interface control layer of Si on the growth of SrF2 on GaAs, Universitaet Kassel, Germany (Prof. F. Traeger), 16 November 1995.

  42. S. Heun: The growth of Si on different GaAs surfaces: A comparative study, Ludwig-Maximilians-Universitaet Muenchen, Germany (Prof. W. Moritz), 9 October 1995.

  43. S. Heun: DC conductivity of ultrathin epitaxial films of Ag, Pb and Au on Si(111), RIKEN, Tokyo, Japan (Dr. T. Hara), 4 March 1994.

  44. S. Heun: Conductivity measurements on one monolayer silver on Si(111), Tokyo University, Japan (Prof. S. Ino), 22 December 1993.

  45. S. Heun: Conductivity of epitaxial silver films, CNRS, Grenoble, France (Prof. T. Lopez-Rios), 12 October 1993.

  46. S. Heun: Metallic and nonmetallic conductivity of thin epitaxial silver films, Freie Universitaet Berlin, Germany (Prof. E. Matthias), 11 June 1993.

  47. S. Heun: Morphology and electrical conductivity of thin Ag films on Ag(111), RWTH Aachen, Germany (Prof. E. Gerlach), 8 June 1993.

  48. S. Heun: The electrical conductivity of thin films of Ag, Pb, and Au on Si(111), CNRS, Paris, France (Prof. F. Cyrot-Lackmann), 25 May 1993.

  49. S. Heun: Surface roughness and conductivity of thin Ag films, Universitaet Duesseldorf, Germany (Dr. D. Schumacher), 12 May 1993.

  50. S. Heun: Magnetoconductivity of thin epitaxial silver films, Universitaet Wuerzburg, Germany (Prof. E. Umbach), April 1993.

  51. S. Heun: Conductance of Ag on Si(111): a two-dimensional percolation problem, Universitaet Bayreuth, Germany (Dr. H. Roeder), December 1992.

Contributed Presentations at Scientific Conferences (47)

  1. N. Paradiso, S. Heun, S. Roddaro, G. Biasiol, L. Sorba, and F. Beltram: Spectral analysis of inter-channel scattering in the QH regime, 4th International Workshop on Emergent Phenomena in Quantum Hall Systems, Beijing, China, 23 - 26 June 2011 (poster). [Abstract] [Lightening Talk] [Poster]

  2. S. Heun: Graphene as a medium for hydrogen storage, Workshop DMD “Atom-based nanotechnology”, Florence, Italy, 19 January 2011 (oral). [Talk]

  3. N. Paradiso, S. Heun, S. Roddaro, D. Venturelli, F. Taddei, V. Giovannetti, R. Fazio, G. Biasiol, L. Sorba, and F. Beltram: Equilibration of integer quantum Hall edge channels studied by scanning gate microscopy, The 6th International Workshop on Nano-scale Spectroscopy and Nanotechnology, Kobe, Japan, 25 - 29 October 2010 (oral). [Abstract] [Talk]

  4. N. Paradiso, S. Heun, S. Roddaro, D. Venturelli, F. Taddei, V. Giovannetti, R. Fazio, G. Biasiol, L. Sorba, and F. Beltram: Equilibration of integer quantum Hall edge channels studied by scanning gate microscopy, 30th International Conference on the Physics of Semiconductors (ICPS-30), COEX, Seoul, Corea, 25 - 30 July 2010 (poster). [Abstract] [Poster]

  5. V. Baranwal, G. Biasiol, S. Heun, A. Locatelli, T. O. Mentes, M. N. Orti, and L. Sorba: Kinetics of the evolution of InAs/GaAs quantum dots to quantum rings, 30th International Conference on the Physics of Semiconductors (ICPS-30), COEX, Seoul, Corea, 25 - 30 July 2010 (oral). [Abstract] [Talk]

  6. N. Paradiso, S. Heun, S. Roddaro, L. N. Pfeiffer, K. W. West, and F. Beltram: Selective control of edge channel trajectories by SGM, 18th International Conference on Electronic Properties of Two-Dimensional Systems EP2DS-18, Kobe, Japan, 19 – 24 July 2009 (poster). [Abstract] [Poster]

  7. S. Heun, G. Biasiol, R. Magri, A. Locatelli, T. O. Mentes, and L. Sorba: Surface compositional profiles of In(Ga)As quantum rings on GaAs(001), 22nd General Conference of the Condensed Matter Division of the European Physical Society, Rome, Italy, 25 – 29 August 2008 (oral). [Abstract] [Talk]

  8. S. Heun, G. Biasiol, R. Magri, A. Locatelli, T. O. Mentes, and L. Sorba: Surface compositional profiles of InAs/GaAs quantum rings, NSS5, Athens, Ohio, USA, 15 – 19 July 2008 (oral). [Abstract] [Talk]

  9. S. Heun, G. Biasiol, G. B. Golinelli, V. Grillo, E. Carlino, L. Sorba, F. Ratto, F. Rosei, S. Kharrazi, S. Ashtaputre, S. K. Kulkarni, S. Fontana, A. Locatelli, T. O. Mentes, and F. Z. Guo: Compositional mapping of semiconductor quantum dots by x-ray microscopy, Workshop of the INTERREG IIIA SLO-ITA project, Trieste, Italy, 23 - 24 October 2006 (oral). [Abstract] [Talk]

  10. S. Heun, G. Biasiol, G. B. Golinelli, A. Locatelli, T. O. Mentes, F. Z. Guo, V. Grillo, E. Carlino, C. Hofer, C. Teichert, and L. Sorba: Surface composition mapping of semiconductor quantum dots, 4th International Workshop on Nanoscale Spectroscopy and Nanotechnology, Rathen, Germany, 17 – 21 September 2006 (oral). [Abstract] [Talk]

  11. S. Heun, F. Ratto, F. Rosei, A. Locatelli, S. Cherifi, S. Fontana, P.-D. Szkutnik, A. Sgarlata, M. De Crescenzi, and N. Motta: Composition of Ge(Si) islands in the growth of Ge on Si(111) by x-ray spectromicroscopy, DPG Fruehjahrstagung and EPS-CMD conference, Dresden, Germany, 27 – 31 March 2006 (poster). [Abstract] [Poster]

  12. S. Heun, G. Biasiol, G. B. Golinelli, A. Locatelli, T. O. Mentes, F. Z. Guo, C. Hofer, C. Teichert, and L. Sorba: Surface concentration mapping of InAs/GaAs quantum dots, DPG Fruehjahrstagung and EPS-CMD conference, Dresden, Germany, 27 – 31 March 2006 (oral). [Abstract] [Talk]

  13. S. Heun, G. Mori, M. Lazzarino, D. Ercolani, G. Biasiol, A. Locatelli, and L. Sorba: Evidence for material mixing during local anodic oxidation nanolithography, SILS 2005, Modena, Italy, 7 – 9 July 2005 (oral). [Abstract] [Talk]

  14. S. Heun, G. Mori, D. Ercolani, M. Lazzarino, A. Locatelli, and L. Sorba: Spectroscopic investigation of oxide nanostructures fabricated by local anodic oxidation, The Third International Workshop on Nanometer Scale Spectroscopy and Nanotechnology, College Park, Maryland, USA, 10 – 14 December 2004 (oral). [Abstract] [Talk]

  15. S. Heun, S. Kremmer, H. Wurmbauer, S. Peißl, and C. Teichert: LEEM and XPEEM studies of C-AFM induced surface modifications of thermally grown SiO2, 14th International Conference on Vacuum Ultraviolet Radiation Physics, Cairns, Australia, 19 – 23 July 2004 (poster). [Abstract] [Poster]

  16. S. Heun, D. Ercolani, G. Mori, M. Lazzarino, B. Ressel, A. Locatelli, S. Cherifi, A. Ballestrazzi, and L. Sorba: Chemical characterization of AFM-defined nanostructures, Thin Films 2004 & Nanotech 2004, Singapore, 13 – 17 July 2004 (oral). [Abstract] [Talk]

  17. S. Heun, L. Gregoratti, A. Barinov, B. Kaulich, M. Rudolf, M. Lazzarino, G. Biasiol, B. Bonanni, and L. Sorba: Morphology and chemistry of S-treated GaAs(001) surfaces, E-MRS 2002 Spring Meeting, Strasbourg, France, 18 – 21 June 2002 (poster). [Abstract]

  18. S. Heun, B. Ressel, Th. Schmidt, Y. Watanabe, and D. Bottomley: Photoelectron spectroscopy from individual heteroepitaxial nanocrystals on GaAs(001), E-MRS 2002 Spring Meeting, Strasbourg, France, 18 - 21 June 2002 (poster). [Abstract]

  19. S. Suzuki, Y. Watanabe, T. Ogino, S. Heun, L. Gregoratti, A. Barinov, B. Kaulich, M. Kiskinova, W. Zhu, C. Bower, amd O. Zhou: Electronic structure of carbon nanotubes studied by photoemission microscopy, Ninth Elettra Users' Meeting, Trieste, Italy, 3 - 4 December 2001 (oral). [Talk]

  20. S. Heun, M. Rudolf, M. Lazzarino, G. Biasiol, B. Bonanni, L. Gregoratti, A. Barinov, B. Kaulich, and L. Sorba: Morphology and chemistry of S-treated GaAs(001) surfaces, VUV 13, Trieste, Italy, 23 - 27 July 2001 (poster). [Abstract] [Poster]

  21. S. Heun, M. Rudolf, M. Lazzarino, G. Biasiol, B. Bonanni, L. Gregoratti, A. Barinov, B. Kaulich, and L. Sorba: Morphology and chemistry of S-treated GaAs(001) surfaces, INFM Meeting, Rome, Italy, 18 - 22 June 2001 (poster). [Abstract] [Poster]

  22. S. Heun, Y. Watanabe, B. Ressel, D. Bottomley, Th. Schmidt, and K. C. Prince: Core level photoelectron spectroscopy from individual heteroepitaxial nanocrystals on GaAs(001), Elettra Users' Meeting, Trieste, Italy, 4 - 5 December 2000 (poster). [Abstract] [Poster]

  23. S. Heun, Th. Schmidt, B. Ressel, F.-J. Meyer zu Heringdorf, P. Zahl, R. Hild, M. Horn-von-Hoegen, and E. Bauer: Au-induced giant faceting of vicinal Si(001): a template for the growth of nanowires, INFM meeting, Genova, Italy, 12 - 16 June 2000 (poster). [Abstract] [Poster]

  24. S. Heun, Y. Watanabe, B. Ressel, Th. Schmidt, and K. C. Prince: Nanospectroscopy of self-organized InAs nanocrystals, CMD-EPS conference, Montreux, Switzerland, 13 -17 March 2000 (poster). [Abstract]

  25. S. Heun, B. Ressel, Th. Schmidt, K. C. Prince, and Y. Watanabe: Nanospectroscopy of self-organized InAs nanocrystals, Elettra Users' Meeting, Trieste, Italy, 29 - 30 November 1999 (poster). [Abstract]

  26. S. Heun, Y. Watanabe, B. Ressel, Th. Schmidt, E. Bauer, and K. C. Prince: Spectromicroscopic measurements of self-organized InAs nanocrystals, X99 conference, Chicago (IL), USA, 23 - 27 August 1999 (poster). [Abstract] [Poster]

  27. S. Heun, Y. Watanabe, Th. Schmidt, E. Bauer, and K. C. Prince: Spectroscopic and microscopic measurements of self-organized InAs nanocrystals, INFM meeting, Catania, Italy, 14.-18.06.1999 (oral). [Abstract]

  28. S. Heun, Th. Schmidt, K. C. Prince, and Y. Watanabe: Spectroscopic and microscopic measurements of self-organized InAs nanocrystals, Spring conference of the German physical society, Muenster, Germany, 22 - 26 March 1999 (oral). [Abstract]

  29. S. Heun, Th. Schmidt, J. Slezak, J. Diaz, K. C. Prince, B. Mueller, and A. Franciosi: Lateral inhomogeneities in engineered Schottky barriers, 6th International Elettra Users' Meeting, Trieste, Italy, 30 November - 1 December 1998 (poster).

  30. S. Heun, T. Schmidt, J. Slezak, J. Diaz, K. C. Prince, B. Mueller, and A. Franciosi: Lateral inhomogeneities in engineered Schottky barriers, 10th International Conference on Molecular Beam Epitaxy, Cannes, France, 31 August - 4 September 1998 (poster). [Abstract]

  31. S. Heun, Th. Schmidt, K. C. Prince, E. Bauer, B. Müller, and A. Franciosi: The SPELEEM at ELETTRA: Recent achievements, INFMeeting, Rimini, Italy, 25 - 30 June 1998 (poster). [Abstract]

  32. S. Heun, Th. Schmidt, J. Slezak, J. Diaz, K. C. Prince, B. Müller, and A. Franciosi: Microscopic-scale lateral inhomogeneities in Schottky barriers, Frühjahrstagung der Deutschen Physikalischen Gesellschaft, Regensburg, Germany, 23 - 27 March 1998 (poster). [Abstract] [Poster]

  33. S. Heun, Th. Schmidt, J. Slezak, J. Diaz, K. C. Prince, G. Lilienkamp, and E. Bauer: The SPELEEM at ELETTRA: A new instrument for spectromicroscopy, 22nd Annual Meeting on Advances in Surface and Interface Physics, Modena, Italy, 17 - 19 December 1997 (poster). [Abstract]

  34. S. Heun, J. J. Paggel, L. Sorba, S. Rubini, A. Bonanni, R. Lantier, M. Lazzarino, A. Franciosi, J.-M. Bonard, J.-D. Ganiere, Y. Zhuang, and G. Bauer: Strain and surface morphology in ZnSe/In0.04Ga0.96As/GaAs(001) heterostructures, US Japan Seminar on Surface Dynamics and Structures in Epitaxial Growth, Nagoya, Japan, 23 - 27 March 1997 (oral). [Abstract]

  35. S. Heun, J. Paggel, L. Sorba, S. Rubini, A. Franciosi, J.-M. Bonard, and J.-D. Ganiere: Stacking fault density and local interface composition in II-VI/III-V heterostructures, DPG Fruehjahrstagung, Muenster, Germany, 17 - 21 March 1997 (poster). [Abstract]

  36. S. Heun, J. J. Paggel, L. Sorba, S. Rubini, A. Franciosi, J.-M. Bonard, and J.-D. Ganiere: Stacking fault density and local interface composition in II-VI/III-V heterostructures, SEmiconduttori-ISolanti SEIS 97, Trento, Italy, 27 - 30 January 1997 (oral).

  37. S. Heun, J. Paggel, S. Rubini, and A. Franciosi: Zn adsorption on GaAs(100)2x4, DPG Fruehjahrstagung, Regensburg, Germany, 25 - 29 March 1996 (poster).

  38. S. Heun, J. J. Paggel, S. Rubini, and A. Franciosi: The influence of Zn predeposition on the properties of ZnSe/GaAs heterostructures, 20th Annual Meeting on Advances in Surface and Interface Physics, Modena, Italy, 18 - 20 December 1995 (oral). [Abstract]

  39. S. Heun, M. Sugiyama, S. Maeyama, Y. Watanabe, and M. Oshima: Electronic and structural properties of thin SrF2 films on InP, 7th International Conference on Indium Phosphide and Related Materials, Sapporo, Japan, 9 - 13 May 1995 (poster). [Abstract]

  40. S. Heun, M. Sugiyama, S. Maeyama, Y. Watanabe, and M. Oshima: The initial stages of the growth of SrF2 on InP, Italian Crystal Growth conference, Brindisi, Italy, 15 - 17 March 1995 (poster). [Abstract]

  41. S. Heun, M. Sugiyama, S. Maeyama, Y. Watanabe, and M. Oshima: SR measurements on SrF2 thin films deposited on InP(111), 8th Annual Meeting of the Japanese Synchrotron Radiation Society, Tsukuba, Japan, 10 - 13 January 1995 (poster). [Abstract]

  42. S. Heun, M. Sugiyama, S. Maeyama, Y. Watanabe, and M. Oshima: Morphology of thin SrF2 films on InP(111) as studied by RHEED, 8. International Conference on Molecular Beam Epitaxy, Osaka, Japan, 29 August - 2 September 1994 (oral).

  43. S. Heun, M. Sugiyama, S. Maeyama, Y. Watanabe, and M. Oshima: Control of epitaxial SrF2 film morphology by atomically modified InP(100), AtomicLayerEpitaxy and Related Surface Processes (ALE-3), Sendai, Japan, 25 - 27 May 1994 (oral).

  44. S. Heun, M. Sugiyama, S. Maeyama, Y. Watanabe, and M. Oshima: The growth of SrF2 on InP(100), 7th Annual Meeting of the Japanese Synchrotron Radiation Society and Asian Forum on Synchrotron Radiation, Kobe, Japan, 11 - 13 May 1994 (poster).

  45. S. Heun, M. Kennedy, and M. Henzler: DC-conductivity of ultrathin epitaxial films of Ag, Pb and Au on Si(111), 13th General Conference of the Condensed Matter Division of the European Physical Society, Regensburg, Germany, 29 March - 2 April 1993 (poster).

  46. S. Heun, J. Bange, R. Schad and M. Henzler: Leitfaehigkeitsmessungen an einer Monolage Silber auf Si(111)-7x7, DPG Fruehjahrstagung, Regensburg, Germany, 16 - 20 March 1992 (poster).

  47. S. Heun, J. Falta und M. Henzler: SPA-LEED Untersuchungen der Startphase der Silicium MBE auf Si(100)2x1, DPG Fruehjahrstagung, Regensburg, Germany, 26 - 30 March 1990 (oral).

Contact

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Dr. Stefan Heun
Senior Scientist

NEST, Istituto Nanoscienze-CNR and Scuola Normale Superiore
Piazza San Silvestro 12
56127 Pisa, Italy

tel. office +39-050-509 472
SGM lab. +39-050-509 467
STM lab. +39-050-509 461
fax. +39-050-509 417

e-mail: stefan.heun@nano.cnr.it